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【Chinatungsten Online News Net- Tungsten News】

Tungsten and tungsten–carbon thin films have been produced from a W target sputtered in argon and argon–methane mixtures, respectively. The deposition rate of W films was measured as a function of the sputtering power and argon pressure varying in the range of 0.3–3 Pa. The crystallographic structure and composition of W films deposited on silicon and carbon substrates were investigated by x‐ray diffraction and Rutherford backscattering spectroscopy. The electrical resistivity of the W films was minimum (12 μΩ?cm) when the internal stresses in the films were negligible. The carbon concentration in the W–C films determined by nuclear reaction analyses and Rutherford backscattering spectroscopy was varied from 10 to 95 at.?% with increasing CH4 content in the gas phase. The crystallographic structure of the W–C films was found to be dependent on the carbon concentration. Below 25 at.?% of carbon, the structure of the W–C films was that of the cubic α‐W phase with a dilated lattice parameter. For higher carbon concentrations, the bcc α‐W phase disappeared and the structure was that of the nonstoichiometric cubic β‐WC1?x phase. The structure of W–C films with a carbon content greater than 65 at.?% was nearly amorphous. Internal stresses and electrical resistivity of W–C films were determined as functions of the carbon concentration. The experimental parameters suitable to produce W and W–C films with low resistivities and reduced internal stress level are reported.